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DTSTART:19700308T020000
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UID:2140535:Event:11542
DTSTAMP:20260406T221323Z
SUMMARY:Materials & Processes for Medical Devices 2009
DESCRIPTION:MPMD 2009: Materials Innovations for Medical Devices\n\nMP
 MD is the only medical devices conference and exposition that brings t
 ogether materials scientists and engineers, metallurgists, product des
 igners, researchers, and clinicians. This event brings together the wo
 rld’s foremost experts from academia, industry, and national laborat
 ories involved in cardiac, vascular, neurological and GI implants, ort
 hopaedic implants, dental devices and surgical instrumentation/devices
 . Materials covered include biomedical alloys (stainless steels, Ti al
 loys, Co-Cr alloys, Ni-Ti alloys, noble and refractory metals), biopol
 ymers, bioceramics, surface coatings, and nanomaterials.\n\nFocus area
 s include: degradation, wear fracture, corrosion, processing, biomimet
 ics, biocompatibility, bioelectric phenomena and electrode behavior, s
 urface engineering, andcell-material interactions.\n\nThe ASM Internat
 ional Materials and Processes for Medical Devices conference and expos
 ition occur on a 24 month interval. The conference provides the latest
  technical insights, exceptional networking, and actionable takeaways 
 for anyone who works with medical devices and innovation.\n\nFor more 
 information visit https://medtechiq.ning.com/events/materials-processe
 s-for
DTSTART;TZID=America/New_York:20090810T080000
DTEND;TZID=America/New_York:20090812T190000
CATEGORIES:annual, conference
LOCATION:Hilton Minneapolis
WEBSITE:http://asmcommunity.asminternational.org/content/Events/MPMD-0
 9/default.htm
URL:http://asmcommunity.asminternational.org/content/Events/MPMD-09/de
 fault.htm
CONTACT:(800) 336.5152
ORGANIZER:ASM International
ATTACH;FMTTYPE="image/jpeg":http://storage.ning.com/topology/rest/1.0/
 file/get/2562004160?profile=original
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=ACCEPTED;RSVP=TRUE;CN="CC-Conra
 d Clyburn-MedForeSight":https://medtechiq.ning.com/profile/CCatMedTech
 IQ
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