BEGIN:VCALENDAR
PRODID:NingEventWidget-v1
VERSION:2.0
METHOD:PUBLISH
BEGIN:VTIMEZONE
TZID:America/New_York
X-LIC-LOCATION:America/New_York
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DTSTART:19700308T020000
RRULE:FREQ=YEARLY;BYMONTH=3;BYDAY=2SU
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:19701101T020000
RRULE:FREQ=YEARLY;BYMONTH=11;BYDAY=1SU
END:STANDARD
END:VTIMEZONE
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DTSTAMP:20260516T034155Z
SUMMARY:Online Webinar on Introduction to SPC (Statistical Process Con
 trol)
DESCRIPTION:Overview: Manufacturing involves an attempt to produce ite
 ms that as closely as possible meet design specifications (e.g., size,
  strength, etc.). However, all production processes exhibit variation 
 - that is, no two items are identical. What method can be used to redu
 ce such variation? The classic and still most widely used method is ca
 lled SPC or \"statistical process control\". SPC is a statistical tool
  that objectively identifies when it is worthwhile to perform a formal
  investigation of manufacturing variation, in order to identify and re
 duce its cause.\nWhy should you Attend: All companies want to improve 
 the quality of their products. Attempts to improve product quality nee
 d to be structured in such a way that they have a reasonable chance of
  success and the cost/benefit ratio is appropriate. The most successfu
 l method available for such endeavors is called SPC (statistical proce
 ss control). SPC can also be used to meet ISO requirements for \"conti
 nual improvement\" as well as FDA requirements to \"control and monito
 r production processes\". SPC can even be used to monitor complaint ra
 tes, to determine if there has been a \"significant\" increase in comp
 laints, which would therefore trigger an MDD \"vigilance report\" and/
 or an FDA MDR submission.\nAreas Covered in the Session:Definition of 
 relevant termsTypes of control chartsCalculation of control limits for
  an XbarR chartRules for detecting \"out of control\"SamplingProcess C
 apability Indices (Cp, Cpk, Pp, Ppk)SPC Program implementation\nWho Wi
 ll Benefit:QA/QC SupervisorProcess EngineerManufacturing EngineerQC/QC
  TechnicianManufacturing Technician\nSpeaker Profile: John N. Zorich h
 as spent 35 years in the medical device manufacturing industry; the fi
 rst 20 years were as a \"regular\" employee in the areas of R&D, Manuf
 acturing, QA/QC, and Regulatory; the last 15 years were as consultant 
 in the areas of QA/QC and Statistics. His consulting clients in the ar
 ea of statistics have included numerous start-ups as well as large cor
 porations such as Boston Scientific, Novellus, and Siemens Medical.\nC
 ontact Detail:Compliance4All DBA NetZealous,Phone: +1-800-447-9407Emai
 l: support@compliance4All.comhttp://www.compliance4all.com/Event Link 
 : http://bit.ly/Statistical_ProcessLinkedIn Like usTwitter Follow usF
 acebook Like us\n\nFor more information visit https://medtechiq.ning.c
 om/events/online-webinar-on-introduction-to-spc-statistical-process-co
 ntrol
DTSTART;TZID=America/New_York:20160616T100000
DTEND;TZID=America/New_York:20160616T113000
CATEGORIES:webinar
LOCATION:Online Event
WEBSITE:http://www.compliance4all.com/
URL:http://www.compliance4all.com/
CONTACT:8004479407
ORGANIZER:Event Manager
ATTACH;FMTTYPE="image/jpeg":http://storage.ning.com/topology/rest/1.0/
 file/get/2562012364?profile=original
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=ACCEPTED;RSVP=TRUE;CN="Adam Fle
 ming":https://medtechiq.ning.com/profile/Compliance4all
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