BEGIN:VCALENDAR
PRODID:NingEventWidget-v1
VERSION:2.0
METHOD:PUBLISH
BEGIN:VTIMEZONE
TZID:America/New_York
X-LIC-LOCATION:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:19700308T020000
RRULE:FREQ=YEARLY;BYMONTH=3;BYDAY=2SU
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:19701101T020000
RRULE:FREQ=YEARLY;BYMONTH=11;BYDAY=1SU
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
UID:2140535:Event:65955
DTSTAMP:20260523T194124Z
SUMMARY:The Statistics of: Design Verification, Process Validation, an
 d Statistical Process Control at SFO
DESCRIPTION:Overview:\nThis 2-day seminar provides a 1-day introductio
 n to the statistical tools used to analyze Design Verification data an
 d Process Validation results. The 2nd day is spent on Statistical Proc
 ess Control and Process Capability Indices. The goal of the 1st day is
  to help the student understand how to choose statistical methods and 
 sample sizes, and to correctly interpret the results. The goal of the 
 2nd say is to explain how to monitor a validated production process, u
 sing tools that will also help improve the product.\nWhy should you at
 tend?\nAll design and/or manufacturing companies perform design verifi
 cation and/or process validation studies. A solid understanding of rel
 evant statistical concepts and methods ensures that such efforts are e
 fficient and accurate. In addition, all validated processes must be mo
 nitored to ensure their continued suitability (per the FDA).\nThe stat
 istical methods used for such activities are easily misused when their
  fundamental principles are not well understood. Mistakes in usage can
  lead to new products being launched that should have been kept in R&D
 ; or, conversely, deciding to not launch a new product because of inco
 rrectly calculated product reliability or process capability. Failure 
 to monitor processes accurately can lead to a slow decline in product 
 quality.\nThis seminar provides a thorough, practical introduction to 
 the relevant statistical methods that will help ensure quality results
  from R&D, Transfer, and Manufacturing.\nAreas Covered in the Session:
 \n\nFDA, ISO 9001/13485, and MDD requirements\nStatistically valid sam
 ple sizes\nThe significance of statistical significance\nThe impact of
  normality and non-normality\nImpact of risk analysis on choice of val
 idation criteria\n\nWho Will Benefit:\n\nQA/QC Supervisor\nProcess Eng
 ineer\nManufacturing Engineer\nQC/QC Technician\nManufacturing Technic
 ian\nR&D Engineer\n\nSpeaker:\nJohn Zorich has spent 35 years in the 
 medical device manufacturing industry; the first 20 years were as a \"
 regular\" employee in the areas of R&D, Manufacturing, QA/QC, and Regu
 latory; the last 15 years were as consultant in the areas of QA/QC and
  Statistics. \n\nLocation: SFO, CA        Date: August 6th & 
 7th, 2015        Time: 9 AM to 6 PM  Venue: DoubleTree by Hil
 ton Hotel San Francisco Airport\nVenue Address: 835 Airport Blvd., Bur
 lingame CA 94010-9949\nPrice: $1,295.00 (Seminar for One Delegate)\nRe
 gister now and save $200. (Early Bird)\nUntil June 15, Early Bird Pric
 e: $1,295.00\nFrom June 16 to August 04, Regular Price: $1,495.00\nCon
 tact Information:\nNetZealous LLC,\nDBA GlobalCompliancePanel\n161 Mis
 sion Falls Lane, Suite 216, Fremont, CA 94539, USA         \n
 USA Phone: 800-447-9407\nFax: 302-288-6884\nsupport@globalcompliancepa
 nel.com          \nhttp://www.globalcompliancepanel.com\nEve
 nt Registration Link - http://bit.ly/1DkWa5y\n\n\nFor more information
  visit https://medtechiq.ning.com/events/the-statistics-of-design-veri
 fication-process-validation-and-1
DTSTART;TZID=America/New_York:20150806T090000
DTEND;TZID=America/New_York:20150807T180000
CATEGORIES:clinical, food, fda, medical, device, defence, and, navy, a
 erospace, mining
LOCATION:DoubleTree by Hilton Hotel San Francisco Airport
WEBSITE:https://www.globalcompliancepanel.com
URL:https://www.globalcompliancepanel.com
CONTACT:18004479407
ORGANIZER:GlobalCompliancePanel
ATTACH;FMTTYPE="image/jpeg":http://storage.ning.com/topology/rest/1.0/
 file/get/2562011438?profile=original
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=ACCEPTED;RSVP=TRUE;CN="John Rob
 inson":https://medtechiq.ning.com/profile/JohnRobinson
END:VEVENT
END:VCALENDAR
