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UID:2140535:Event:78810
DTSTAMP:20260524T120947Z
SUMMARY:Webinar On \"Use Sequential Sampling to Reduce Attribute Sampl
 ing Costs\"
DESCRIPTION:\nDescription :\nANSI/ASQ Z1.9 (formerly MIL-STD 105) is a
 n internationally recognized set of sampling plans for attribute (pass
 /fail, good/bad, or defect count) data. The standard specifies, on the
  basis of (1) the lot size N, (2) the inspection level, and (3) the ac
 ceptable quality level (AQL), a sample size n and acceptance number c.
  If the number of nonconformances exceeds the acceptance number, the l
 ot is rejected. This does not mean the entire lot is thrown away, but 
 rather that 100% inspection is required to remove all nonconforming it
 ems and possibly replacing them with known good ones.\n\nObjective :\n
 Use ANSI/ASQ Z1.9 to define a sampling plan on the basis of (1) the lo
 t size N, (2) the inspection level, and (3) the acceptable quality lev
 el (AQL).\nBe aware of the \"chutes and ladders\" (up and down arrows)
  aspect of the sampling tables.\n\n\nKnow how double and multiple samp
 ling plans reduce the amount of inspection and therefore inspection co
 sts\nGenerate a sequential sampling plan whose performance is identica
 l to that of the corresponding ANSI/ASQ Z1.9 plan at the operating cha
 racteristic curve points (AQL, 1-a) and (RQL, b).\nThis can be done in
  Microsoft Excel, and attendees will be provided with a spreadsheet, o
 r an off-the-shelf program like StatGraphics.\n\n\n\n\n\n\n\n\nAreas C
 overed in the Session :\n\nComprehensive overview of ANSI/ASQ Z1.9 inc
 luding\nGeneration of a sequential sampling plan whose performance (op
 erating characteristic curve) is essentially identical to that of the 
 corresponding ANSI/ASQ Z1.9 plan\n\n\n\n\n\n\nWho Will Benefit:\nALL Q
 uality managers, engineers, and technicians with responsibility for lo
 t inspections that use attribute data.\n\n\n\n\nAbout Speaker:\nWillia
 m A. Levinson, P.E., FASQ, CFPIM, is the owner of Levinson Productivit
 y Systems PC. He holds professional certifications from the American S
 ociety for Quality, APICS, and Society of Manufacturing Engineers.\n\n
 \n\n\n\n\nFor more information visit https://medtechiq.ning.com/events
 /webinar-on-use-sequential-sampling-to-reduce-attribute-sampling
DTSTART;TZID=America/New_York:20180228T130000
DTEND;TZID=America/New_York:20180228T140000
CATEGORIES:online, "/", webinar
LOCATION:Online
WEBSITE:http://bit.ly/2okAlV0
URL:http://bit.ly/2okAlV0
CONTACT:1-844-216-5230
ORGANIZER;CN="Sam Miller":https://medtechiq.ning.com/profile/SamMiller
ATTACH;FMTTYPE="image/jpeg":http://storage.ning.com/topology/rest/1.0/
 file/get/2562017555?profile=original
ATTENDEE;ROLE=REQ-PARTICIPANT;PARTSTAT=ACCEPTED;RSVP=TRUE;CN="Sam Mill
 er":https://medtechiq.ning.com/profile/SamMiller
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