The Cutting Edge of Medical Technology Content, Community & Collaboration
Time: July 9, 2015 at 9am to July 10, 2015 at 6pm
Location: Mandarin Orchard Singapore
Street: 333 Orchard Road, Singapore 238867
City/Town: Singapore
Website or Map: https://www.globalcompliancep…
Phone: 18004479407
Event Type: clinical, food, fda, medical, device, defence, and, navy, aerospace, mining
Organized By: GlobalCompliancePanel
Latest Activity: Apr 22, 2015
Prior to developing a process control plan as part of an overall risk management strategy, process development studies must be completed. The objective of these process development studies is to gain knowledge and understanding about how variation in process parameters explains variation in the product quality characteristics of the product.
The use of DOE methodology provides a means to identify process parameters which impact product quality (critical process parameters) and determine the functional relationship that links the process parameters to that critical quality attributes. Screening designs, such as 2k factorial and D-optimal designs are used to determine critical process parameters.
Learn how to effectively use JMP to:
Heath Rushing is the cofounder of Adsurgo and author of the book Design and Analysis of Experiments by Douglas Montgomery: A Supplement for using JMP. Previously, he was the JMP and Six Sigma training manager at SAS. He led a team of nine technical professionals designing and delivering applied statistics and quality continuing education courses.
Location: Singapore Date: July 9th & 10th, 2015 Time: 9:00 AM to 6:00 PM
Venue: Mandarin Orchard Singapore
Venue Address: 333 Orchard Road, Singapore 238867
Price: $2,095.00
(Seminar for One Delegate)
Register now and save $200. (Early Bird)
Contact Information:
NetZealous LLC,
DBA GlobalCompliancePanel
161 Mission Falls Lane,
Suite 216, Fremont, CA 94539, USA
USA Phone: 800-447-9407
Fax: 302-288-6884
support@globalcompliancepanel.com
http://www.globalcompliancepanel.com
Registration Link: http://bit.ly/1HJRVWP
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